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Scanning Near Field Optical Microscope

The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements.

The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM). This is employing the SPMs precision of piezoelectric raster-scanning together with small sharp optical probe to obtain optical images at subwavelength resolution.


TriA SNOM combines the potentials of scanned probe technology with the power of optical microscopy. It brings a small optical probe very close to the sample surface, in the region called "near-field", and it allows the collection of optical signals providing image optical resolution below 100 nm.

Key features:

  • Integrated Double Optical Vision System for accurate positioning and far field optical investigation
  • Compatible with a wide range of light microscope modes
  • Separate or simultaneous transmission and reflection measurements
  • Large Operation wavelength range
  • Allows the light source set-up as top down or inverted
  • Independent high-performance photo detectors for multiple optical signals collection.
  • Easily expandable
  • Compatibility with third party scientific equipments


Imaging the optical properties of a sample with resolution below the diffraction limit with applications in nanotechnology, biological studies, polymer investigations study of semiconductor materials

Italia degli innovatori - innovazione selezionata EXPO Shangai 2010

Technical Specifications