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The invention and subsequent development of scanning
probe microscopy (SPM) methods have produced the necessary tools for a
step forward in optical measurements.
The possibility to go beyond the Abbe diffraction limit has been
achieved with the Near-field light optical microscopes (SNOM). They
employ SPMs precision of piezoelectric raster-scanning together with
sharp probes to obtain light optical images at subwavelength resolution.
Particular care has been taken to different applications
from solid state to biomedicine.
The goal of our company is to give to the customers the instrument that
best fit their needs.
This product is the result of a collaboration between A.P.E. Research
and National Research centers.
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