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 AFM
 AFM A100
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TriA SPM
Scanning Probe Microscope

TriA SPM
Key features:

  • Double optical sample observation (upright and inverted) for transparent and opaque samples
  • Completely decoupled scanners for XY and Z configuration
  • Large scanning ranges up to 250 μm
  • Automatic tip sample approach
  • High versatility for SPM and optical techniques
  • Compatibility with third party scientific equipments

Working modes:

AFM Mode: supports major SPM scanning techniques: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy, etc.
TriA SPM
Technical Specifications
Brochure