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 AFM A100
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A100 AFM
Atomic Force Microscope

A100 AFM
Key features:

  • Robust and reliable operation high-end research Scanning Probe Microscope
  • Monoatomic step resolution even with 100 x 100 μm scanner
  • High accuracy in repositioning over all scanning range with no border distortion
  • High Sensitivity for low force measurements
  • Best for soft materials
  • Modular structure capable to provide different scanning probe modes. The system can be upgrade with different new modules.
Working modes:

A100 supports major SPM scanning techniques1: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Force Modulation, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy , STM, etc.

1 : Included by way of example
A100 AFM
Technical Specifications