Atomic Force Microscope
- Robust and reliable operation high-end research Scanning Probe Microscope
- Monoatomic step resolution even with 100 x 100 μm scanner
- High accuracy in repositioning over all scanning range with no border distortion
- High Sensitivity for low force measurements
- Best for soft materials
- Modular structure capable to provide different scanning probe modes. The system can be upgrade with different new modules.
A100 supports major SPM scanning techniques1: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Force Modulation, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy , STM, etc.
1 : Included by way of example