This website uses third-party cookies for videos and interactive maps display. Accept Learn more
Company Products Research and Development Projects Careers Contact us
 AFM
 AFM A100
 TriA SPM
 TriA SNOM
 STM
 SPM Images
 SPM Probes
 SPM Accessories
 Instrumentation

 

A100 AFM
Atomic Force Microscope

A100 AFM
Key features:

  • Robust and reliable operation high-end research Scanning Probe Microscope
  • Monoatomic step resolution even with 100 x 100 μm scanner
  • High accuracy in repositioning over all scanning range with no border distortion
  • High Sensitivity for low force measurements
  • Best for soft materials
  • Modular structure capable to provide different scanning probe modes. The system can be upgrade with different new modules.
Working modes:

A100 supports major SPM scanning techniques1: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Force Modulation, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy , STM, etc.

1 : Included by way of example
A100 AFM
Technical Specifications
Brochure