TriA SPM Scanning system:

Scanning stage with absolute positioning system and strain gauge sensors.

Scanner technical data:*

X-Y scan size:

• 100 x 100μm (high voltage mode);
• 10 x 10 μm (low voltage mode)
• High voltage mode closed loop resolution: 2 nm
• High voltage mode open loop resolution: 0.2 nm
• Closed loop linearity: 0.1%.

Z scan size:

• 10 μm (high voltage mode)
• 1 μm (low voltage mode)
• Resolution: 0.16 nm (high voltage mode), 0.02 nm (low voltage mode)

Sample size: can accommodate samples with different geometries and sizes up to 30 mm diameter.

SPM Control System is composed by a digitally controlled analog feedback that combines the flexibility of computer controlled parameters with the high resolution and low noise of an analogue implementation. This detection scheme provides sub-nanometric vertical resolution in the images and all collected signals are distortions free.
The electronics supports STM, AFM and SNOM heads, performs different kinds of spectroscopy and can acquire several user-defined auxiliary channels.

Acquisition software
Software runs under Windows and is composed of a multi- window application to control the instrument and do the data acquisition. The software controls all the parameters of the instrument.

Accessories:
In order to provide different working modes A.P.E. Research have developed different dedicated tools (e.g. MFM Tool, EFM Tool, CAFM Tool, Liquid Cell, KFM Tool, Phase imaging, etc.).

* Other ranges are available on demand. Please contact your local distributor for specific configuration.

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Characteristics and technical specifications are subject to change