• Includes EFM/MFM sample holder for bias, test sample, and EFM Cantilevers.

 MFM Tool

• Includes MFM Tip magnetizer, non magnetic sample holder for MFM sample, test sample, and 3 MFM cantilever.

Force Modulation Mode

• Includes Tip modulated software and test sample Set of Tip Holders

ScanningThermal Microscopy

• Measuring temperature profiles of sample surface. Includes amplifier, head extension module for SThM, and SThM Cantilevers.

Open Liquid Cell

• Includes Liquid chamber and cantilever holder. Cell is PTCFE, 1.3 ml for up to 10 mm sample.

AFM Tips and calibration gratings

• APE Research supplies a wide range of AFM probes, calibration gratings and other accessories for scanning probe microscopes from MikroMasch.
  Please contact us for a quotation
  

• AFM general Informations

• AFM R80
• Technical Specifications
  
• AFM A-50/100S/100L
• Technical Specifications

• Accessories
• Air STM tool
• Additional Tools
• Laboratory Accessories

• Download AFM Brocure (PDF file, 220 KB)
• AFM sample images