Aperture SNOM  
  Technical Specifications  
 
 
  • Aperture mode SNOM in emission mode
  • Transmission (for transparent samples) and reflection
    configurations are possible
  • Light detection by fototube in either mode is obtained via optical
    elements
  • Fibers: Commercially available "Tapered" sensors with 50 nm
    hole (nominal value) Typical emission is 1 nW. Sensors come
    already mounted on A.P.E. Research sample holder.
  • Near field laser: external source on laboratory table
  • Maximum scan area: 85 mm x 85 mm
  • Maximum surface area: 9 cm2. Thickness up to 8 mm
  • Macroscopic translator range: 13 x 13 x 13 mm. Manual X-Y
    movement, servo-assisted Z movement with 100 nm minimum
    step
  • Lateral resolution: better than 50 nm, reaching the theoretical
    limit for the aperture instruments
  • SPM Control System is composed by a digitally controlled analog feedback that combines the flexibility of computer controlled parameters with the high resolution and low noise of an analogue implementation. The electronics supports STM, AFM and SNOM heads, performs different kinds of spectroscopy and can acquire several user-defined auxiliary channels.

  • Software runs under Windows and is composed of multi-
    window applications to control the instrument and perform the data
    acquisition. The software controls all the parameters of the
    instrument.
 
   

 
Key features:
 
  • Ease of Use
  • Versatility
  • Easily interchangeable Samples
  • Easy switching between acquisition modes
  • Lateral Resolution better then 50 nm
 

    pdf (130 KB)