The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements.
The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM). They employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at subwavelength resolution.

Particular care has been taken to different applications from solid state to biomedicine.
The goal of our company is to give to the customers the instrument that best fit their needs.

This product is the result of a collaboration between A.P.E. Research and National Research centers.

• TriA-SNOM
  An Aperture SNOM microscope, capable of collecting optical signal in reflection, transmission and back-reflection modes. An instrument for surface science, optics and biology researchers who need a basic microscope easily expandable and interfaciable with their scientific equipement.
  
• Technical Specifications
• Download TriA-SNOM Brocure (PDF file, 344 KB)
  

• The three operating modes of TriA-SNOM
• SNOM sample images
• Dual Lock-in
• Fluorescence detection