| Aperture SNOM | ||||
| Scanning Near Field Optical Microscope | ||||
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The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM). SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. Particular care has to be taken in the fact that the
application of this physical principle to different particular
problemsin solid state or biological applications leads to very
different technical solutions from a technological point of view. For this reason our company collaborates with our
customers in order to to give them an instrument which could be as much
as possible tuned to their needs. SNOM microscopes are also equipped with a set of accessories to improve the functionality and increase the range of possible measuraments.
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