Scanning Probe Microscopes are particular types of microscopes that exploit physical variables in order to construct an image with very high level enlargement. They are very simple to use: a very sharp probe is positioned close to the surface (a few nanometers, billionth of meter) and is run across the entire surface, measuring the interaction between the probe and the surface at each point. According to the properties measured, the instrument makes it possible to obtain images of the layout of the surface or regarding magnetic or chemical properties.
A.P.E. Research provides industrial and academic laboratories with
easy-to-use SPM systems. All models presented are the base
versions of our instruments: all of then can be customized upon specifications of customers.
Detailed descriptions are available on this site. See downward links.
Software runs under Windows XP and is composed of a multi-window application for instrument control and data acquisition. All scanning and control parameters could be set via software.
Several spectroscopy modes could be activated, even from external variables source.
The software also cames equipped with essential filters for immediate analysis of acquired images (Line profiles, Plane and DC subtraction, Hi and Low pass filters, Inverse, median, Sobel, Crispening, Math operations, Gamma Correction, ...).
Custom made modules could be added on request.
The software could be downloaded and tested in a DEMO mode.
Please contact our staff at e-mail company addresses.
- 3D Visualization Studio
With the 3D Visualization Studio you can generate spectacular 3D images and movies. - Batch Processing
The SPIP™ Batch Processor is the perfect tool and time saver for analyzing large series of data files and creating impressive reports. - Calibration
The Calibration Module enables you to perform measurements with sub-pixel accuracy. - CITS Continuous Imaging Tunneling Spectroscopy
The CITS Continuous Imaging Tunneling Spectroscopy is used for visualization and analysis of CITS volume data. - Correlation Averaging
Correlation Averaging allows you to enhance weak structures in repeated patterns, such as atomic crystalls, self assembled molecules or etched patterns. - Extended Fourier
The Fourier Analysis Module enables you to detect and quantify repetitive patterns, such as atomic lattice structures and perform advanced filtering. - Filter
SPIP™ provides a comprehensive set of filter types that can be customized for removal of a large variety of distortions and getting closer to the true surface image. - Force Curve Analysis
The Force Curve Analysis Module has dedicated tools for analyzing force curves and creating deflection data into Force vs. Separation curves. - Grain Analysis
The Grain Analysis Module contains powerful tools for detecting and quantifying grains and pores, even in situations where the background image contains different levels. - Imagemet Explorer
Imagemet Explorer is a file management tool adding a new dimension to image and data handling. It contains an integrated database that allows you to browse quickly through your data files and view them as thumbnails together with numerical results. - Movie & Time Series Analysis
The Movie & Time Series Analysis Module enables you to combine image series into drift corrected movies and study time dependent behavior. - Plug-In Interface
The Plug-In Interface Module allows you to program your own plug-in programs for SPIP™. - Roughness Analysis
The Roughness Analysis module can characterize images and cross section profiles by more than 20 parameters and visualize the results by more than 7 graphs. - Tip Characterization
The SPIP™ Tip Characterization Module allows you to characterize the tip or stylus used for scanning and to compensate for the tip shape by Tip Deconvolution.
