Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.

APE Research produces several AFM instrument models, in order to satisfy the different needs of customers.
The R80-AFM is a low cost instrument, equipped with an open loop nanopositioning system for customers interested in standard AFM measurements.
The A-series Microscopes mount closed loop sample positioning system. This feature garantees absolute positioning with an accuracy of 2 nm (from ten to twenty times better than closed loop AFM in the market).

AFM Lithography
A50/A100 models, equipped with close loop positioning systems, are suitable for nanolitography. A specific software module has been developed to the reproduction of lines and patterns on the sample surface in scratching mode. Also force, voltage and offset parameters could be varied. Patterns could be drawn directly on line or imported from file (HPGL file format).

Standard accessories
A.P.E. Research has developed additional AFM tools for specific measurements modes (STM, EFM, MFM, Liquid Cell). Other tools can be developed upon customer requests and in a joint collaboration.

• AFM R80
• Technical Specifications
  

• AFM A-50/100S/100L
• Technical Specifications

• Accessories
• Air STM tool
• Additional Tools
• Laboratory Accessories

• Download AFM Brocure (PDF file, 220 KB)
• AFM sample images