AFM
	Atomic Force Microscope
	A.P.E. Research s.r.l. produces two versions of Atomic Force Microscope (AFM). The A100-AFM is equipped with a closed loop sample positioning system. It guarantees absolute positioning with an accuracy of 10 nm (up to ten times better than closed loop AFM in the market). This particular feature, together with the specific A.P.E. Research software tool, makes the instrument suitable for nano-lithography. The A100-AFM SGS is equipped with a flexure scanning stage that guarantees high planarity  for customers interested in large area AFM measurements (up to 100 mm). A.P.E. Research has developed additional AFM tools for specific measurements modes (EFM, MFM, Liquid Cell). Other tools are developed upon customer requests or in a joint collaboration with Italian research institutions.
	AFM R80 Technical Specifications
	AFM A100-SGS   A50-CL Technical Specifications
	Accessories Air STM tool Additional Tools Laboratory Accessories
	Download AFM Brocure (PDF file, 437 KB) AFM sample images		pdf (437 KB)