Scanning Probe Microscopes are particular types of microscopes that exploit physical variables in order to construct an image with very high level enlargement. They are very simple to use: a very sharp probe is positioned close to the surface (a few nanometers, billionth of meter) and is run across the entire surface, measuring the interaction between the probe and the surface at each point. According to the properties measured, the instrument makes it possible to obtain images of the layout of the surface or regarding magnetic or chemical properties.

A.P.E. Research supports customers in setting-up instrumentation and performing measurements. Here's a sample.

Gold Nanoparticles on Silicon

Cells SNOM Topography

SNOM Optical Reflection
Cytoskeleton fibers

SNOM Topography
Thin film on Si substrate

SNOM Optical Reflection
Thin film on Si substrate

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